Paper
20 April 1998 Aging of elements of the integral optics and light guides
Georgii E. Chaika, V. N. Malnev, M. I. Panfilov, D. E. Edgorbekov
Author Affiliations +
Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306265
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine
Abstract
We consider excitations of the electron subsystem when the electromagnetic radiation passes through elements of the integral optics and light guides. The excitation results in the formation of point and finite defects. They change the system index of refraction and cause an additional light scattering.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Georgii E. Chaika, V. N. Malnev, M. I. Panfilov, and D. E. Edgorbekov "Aging of elements of the integral optics and light guides", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306265
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KEYWORDS
Light scattering

Waveguides

Dielectrics

Optical components

Chemical species

Electromagnetic radiation

Excitons

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