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20 April 1998 Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry
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Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306204
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine
Abstract
We present a simple, accurate and inexpensive interferometric technique based on the spectrally resolved white-light interferometry to determine the group-delay dispersion of optical elements, such as laser crystals and multilayer mirrors. Due to the different dispersion properties of these elements, different evaluation methods of the interference fringes are used for the mirrors and crystals. The reproducibility of our measurements is +/- 5 fs2 and +/- 3% for mirrors and crystals, respectively, with high spectral resolution over a broad spectra range (700 - 900 nm). These dispersion data are important for the construction of compact femtosecond solid-state lasers.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zsolt Bor, Attila P. Kovacs, Karoly Osvay, and Robert Szipocs "Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306204
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