20 April 1998 Optical methods of control and characterization of materials for infrared detectors
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Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306201
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine
Abstract
A brief review is made of some classic and novel experimental techniques allowing the determination of the main parameters of semiconducting materials with the application of purely optical excitation. Among them some modifications of the photothermoacoustical method (in particular, with the pulse excitation), plasma reflection, sample scanning with the intense light beam.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuri V. Vorobiev, Jesus Gonzalez-Hernandez, Martin Yanez-Limon, Juan Francisco Perez-Robles, Francisco J. Espinoza-Beltran, Rafael Ramirez-Bon, Valery N. Zakharchenko, Roman V. Zakharchenko, "Optical methods of control and characterization of materials for infrared detectors", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306201; https://doi.org/10.1117/12.306201
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