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It is shown that short-wave emission of Tb3+ may be using as an optical indicator of thin film electroluminescent structures matrix changes because that emission shows a high spectral response to the crystal field symmetry change near Tb3+ ion. Depending on the conditions of preparation of the film, the annealing temperature, the action of the gamma-ray radiation of the Tb3+ electroluminescent spectra's view corroborates the conclusion. Electroluminescent long-wave part spectra compared with short-wave part spectra at T equals 4.2 divided by 300 K regarding the dependence on film preparation conditions. Such comparisons demonstrate an advantage of using over `green' emission of `violet' emission terbium as an optical indicator.
V. S. Khomchenko,V. E. Rodionov, andYu. A. Tzirkunov
"Short-wave emission of Tb3+ as an optical indicator of TFELS matrix changes", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306226
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V. S. Khomchenko, V. E. Rodionov, Yu. A. Tzirkunov, "Short-wave emission of Tb3+ as an optical indicator of TFELS matrix changes," Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306226