20 April 1998 Use of photodepolarization spectra for diagnostics and characterization of alternating current thin-film electroluminescent (ACTFEL) devices
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Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306271
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine
Abstract
New non-destructive method of diagnostics and characterization of ACTFEL devices based on analysis of experimental and calculated photodepolarization spectra is proposed. This method gives an important information concerning the signa nd spatial distribution of polarization charge which influence significantly on characteristics of ACTFEL devices. The methodology and various variants of the method are considered. The simulation of PDP spectra is provided. Capabilities of the method are illustrated by the PDP spectra of ZnS:Mn and SrS:Ce devices fabricated by various techniques.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nataliya A. Vlasenko, Nataliya A. Vlasenko, A. I. Beletskii, A. I. Beletskii, Z. L. Denisova, Z. L. Denisova, Ya. F. Kononets, Ya. F. Kononets, L. I. Veligura, L. I. Veligura, } "Use of photodepolarization spectra for diagnostics and characterization of alternating current thin-film electroluminescent (ACTFEL) devices", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306271; https://doi.org/10.1117/12.306271
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