14 September 1998 Attributes and drawbacks of submicron CMOS for IR FPA readouts
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Abstract
The availability of submicron CMOS has enabled the development of shingle-chip IR cameras having performance capabilities and on-chip functions which were previously impossible. Sensor designers are, however, encoutering and overcoming several challanges including steadily decreasing operating voltage.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. J Kozlowski, "Attributes and drawbacks of submicron CMOS for IR FPA readouts", Proc. SPIE 3360, Infrared Readout Electronics IV, (14 September 1998); doi: 10.1117/12.584058; https://doi.org/10.1117/12.584058
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