Imaging pyrometry of oxides

Michael E. Thomas; Patrick S. Wayland; David H. Terry

doi:10.1117/12.304720

26 March 1998 Imaging pyrometry of oxides

Michael E. Thomas, Patrick S. Wayland, David H. Terry

Proceedings Volume 3361, Thermosense XX; (1998) https://doi.org/10.1117/12.304720
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

A technique for imaging pyrometry of oxides will be presented which is capable of remotely determining the temperatures of an oxide surface with useful accuracy. The technique relies on the near-blackbody emittance properties of most oxides in the two-phonon spectral region. Most oxides in the longwave IR region are very highly emitting with an emittance that is almost temperature independent and Lambertian. We present a generalized calibration procedure for longwave cameras that allows spatially resolved surface temperature to be obtained from radiance measurements. Experimental results from a sapphire disk will be presented as a demonstration of the technique.

Citation Download Citation

Michael E. Thomas, Patrick S. Wayland, and David H. Terry "Imaging pyrometry of oxides", Proc. SPIE 3361, Thermosense XX, (26 March 1998); https://doi.org/10.1117/12.304720

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available