26 March 1998 Imaging pyrometry of oxides
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Abstract
A technique for imaging pyrometry of oxides will be presented which is capable of remotely determining the temperatures of an oxide surface with useful accuracy. The technique relies on the near-blackbody emittance properties of most oxides in the two-phonon spectral region. Most oxides in the longwave IR region are very highly emitting with an emittance that is almost temperature independent and Lambertian. We present a generalized calibration procedure for longwave cameras that allows spatially resolved surface temperature to be obtained from radiance measurements. Experimental results from a sapphire disk will be presented as a demonstration of the technique.
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Michael E. Thomas, Patrick S. Wayland, David H. Terry, "Imaging pyrometry of oxides", Proc. SPIE 3361, Thermosense XX, (26 March 1998); doi: 10.1117/12.304720; https://doi.org/10.1117/12.304720
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