14 September 1998 Device reliability issues in field emission displays
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Field emission displays are currently making the transition from R&D into prototypes and early production. Device reliability is a critical issue in realization of successful field emission displays that are able to compete with other established technologies like active matrix liquid crystal displays and thin film electroluminescent displays. In this paper, we review the fundamental issues affecting the reliability and operational life of field emission display systems.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Babu Chalamala, Babu Chalamala, Robert H. Reuss, Robert H. Reuss, Troy A. Trottier, Troy A. Trottier, Cecil W. Penn, Cecil W. Penn, Yi Wei, Yi Wei, } "Device reliability issues in field emission displays", Proc. SPIE 3363, Cockpit Displays V: Displays for Defense Applications, (14 September 1998); doi: 10.1117/12.321806; https://doi.org/10.1117/12.321806

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