22 July 1998 Performance of corrugated quantum well infrared photodetectors
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Corrugated quantum well infrared photodetectors (C-QWIPs) use total internal reflection to couple normal incident light into the detectors. In this work, we report the performance of C- QWIPs at different wavelengths. Compared with 45 degrees edge coupling, a C-QWIP increases the background photocurrent to dark current ratio rI by a factor between 2.4 and 4.4, thereby increasing the background-limited temperature by 3 to 5 K. The detectivity D* is increased by a factor of 2.4. We applied the C-QWIP to two-color detection and obtained precision thermometric measurements. We have also fabricated and characterized a 256 X 256 C-QWIP array with cutoff wavelength at 11.2 micrometer. The uncorrected nonuniformity ((sigma) /mean) in the central 128 X 128 subarray is 2.3%. The NE(Delta) T at 63 K is estimated to be 23 mK. Furthermore, we have shown that rI can be further increased by fabrication of the C-QWIP into the corrugated hot-electron transistor structure. The enhanced performance of the corrugated structure, combined with its simple processing steps, greatly improves the QWIP technology.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kwong-Kit Choi, Kwong-Kit Choi, C. J. Chen, C. J. Chen, Arnold C. Goldberg, Arnold C. Goldberg, Wayne H. Chang, Wayne H. Chang, Daniel C. Tsui, Daniel C. Tsui, } "Performance of corrugated quantum well infrared photodetectors", Proc. SPIE 3379, Infrared Detectors and Focal Plane Arrays V, (22 July 1998); doi: 10.1117/12.317612; https://doi.org/10.1117/12.317612


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