31 March 1998 Electromagnetic microscope compared with a conventional pulsed eddy-current probe
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Abstract
A superconductive probe presently can detect a crack at a rivet hole that is two to three times smaller than the smallest crack detectable by a conventional probe. As the technology matures and noise resolution approaches a limit set by SQUIDS, approximately 1 fH, it will enable detecting submillimeter cracks down to approximately 15 mm.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Walter N. Podney, "Electromagnetic microscope compared with a conventional pulsed eddy-current probe", Proc. SPIE 3397, Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware II, (31 March 1998); doi: 10.1117/12.305058; https://doi.org/10.1117/12.305058
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KEYWORDS
Skin

Electromagnetism

Microscopes

Reflection

Superconducting detectors

Aluminum

Copper

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