23 October 1998 New model for optimization of erasure time in reversible optical memories including shape factor, temperature, and mass effects on incubation time in various nucleation processes
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Proceedings Volume 3401, Optical Data Storage '98; (1998) https://doi.org/10.1117/12.327948
Event: Optical Data Storage '98, 1998, Aspen, CO, United States
Abstract
Work is in progress for improving the switching times of erasable as well as DOW type of optical memories. As it has been already established that the erasure time (ayieldsc) is dominated by incubation time ((tau) ), hence (tau) needs to be explored more in depth. In the present work the mass, molecular diameter and density effects have been shown in addition to the temperature effects. The earlier calculations could only estimate the value of (tau) using a range of critical radii values, whereas the present model can be used to calculate the exact values of critical radii using shape factor calculations for grain boundary, grain edge and grain corner nucleation separately. Knowing the material parameter of a system, one can calculate variation of (tau) with temperature, mass or composition.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Swati Nagpal, Promod K. Bhatnagar, Pankaj Pathak, "New model for optimization of erasure time in reversible optical memories including shape factor, temperature, and mass effects on incubation time in various nucleation processes", Proc. SPIE 3401, Optical Data Storage '98, (23 October 1998); doi: 10.1117/12.327948; https://doi.org/10.1117/12.327948
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