26 May 1998 Possibility of excitation temperature determination by relative deviation plot of line intensities
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Proceedings Volume 3404, ALT'97 International Conference on Laser Surface Processing; (1998) https://doi.org/10.1117/12.308648
Event: ALT '97 International Conference on Laser Surface Processing, 1997, Limoges, France
Abstract
Method of relative deviation plot of line intensities for LTE presence verification and excitation temperature determination is suggested and analyzed. This method seems to be attractive as it does not require the values of the Einstein constants Aji of spontaneous emission.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexandre F. Semerok, "Possibility of excitation temperature determination by relative deviation plot of line intensities", Proc. SPIE 3404, ALT'97 International Conference on Laser Surface Processing, (26 May 1998); doi: 10.1117/12.308648; https://doi.org/10.1117/12.308648
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