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26 May 1998 Surface defect induced by strong electric field probed by soft x-ray laser interferometry
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Proceedings Volume 3404, ALT'97 International Conference on Laser Surface Processing; (1998) https://doi.org/10.1117/12.308642
Event: ALT '97 International Conference on Laser Surface Processing, 1997, Limoges, France
Abstract
We use x-ray laser interferometry to probe defects induced by a strong electric field on niobium surface. Niobium has been chosen on account of its frequent use in superconductive cavities of particle accelerators. The x-ray laser emits bright, 50 ps-duration pulses at (lambda) equals 21.2 nm. The beam is reflected on the niobium surface under grazing incidence. The interferometer is of the wave-front division type. Interferograms are single shot recorded, which enables to probe `instantaneous' defect morphology. We observed appearance and evolution of defects between 14 MV/m and 35 MV/m. The vertical set amplitude is of 10 - 20 nm. The defect structure has been observed to shift by 500 micrometers along the metal surface under a constant 35 MV/m electric field, during the 20 minutes time interval between two laser shots.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Albert, Philippe Zeitoun, Denis Joyeux, Mustapha Boussoukaya, Antoine Carillon, S. Hubert, Pierre Jaegle, Gerard Jamelot, Annie Klisnick, Daniel Phalippou, David Ros, Stephane Sebban, and Anne Zeitoun-Fakiris "Surface defect induced by strong electric field probed by soft x-ray laser interferometry", Proc. SPIE 3404, ALT'97 International Conference on Laser Surface Processing, (26 May 1998); doi: 10.1117/12.308642; https://doi.org/10.1117/12.308642
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