2 July 1998 Characteristics of a carbon/nickel multilayer structure for soft x-ray optics deposited by rf magnetron sputtering
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Proceedings Volume 3405, ROMOPTO '97: Fifth Conference on Optics; (1998) https://doi.org/10.1117/12.312727
Event: ROMOPTO '97: Fifth Conference on Optics, 1997, Bucharest, Romania
Abstract
In order to make X-ray-UV interference mirrors, we tried to obtain a periodic multilayer structure with thin films of two materials, a high absorption material (Ni) and a low absorption material (C) on a quartz substrate. We present theoretical approaches to determine the optimum values of the thicknesses of each thin film and the number of periods required for maximum reflectivity at normal incidence of a soft X-ray mirror working at (lambda) equals 50 angstroms. We also describe the experimental procedures used for obtaining the multilayer structure and the microscopically investigations.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Magdalena Ulmeanu, Magdalena Ulmeanu, Geo Georgescu, Geo Georgescu, Rares V. Medianu, Rares V. Medianu, Nicoleta Nastase, Nicoleta Nastase, Cornel Ghica, Cornel Ghica, Virgil V. Vasiliu, Virgil V. Vasiliu, } "Characteristics of a carbon/nickel multilayer structure for soft x-ray optics deposited by rf magnetron sputtering", Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); doi: 10.1117/12.312727; https://doi.org/10.1117/12.312727
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