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2 July 1998 Optical properties of polycrystalline InxGa1-xSb (x=0.20) from 15 to 30 μm
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Proceedings Volume 3405, ROMOPTO '97: Fifth Conference on Optics; (1998) https://doi.org/10.1117/12.312676
Event: ROMOPTO '97: Fifth Conference on Optics, 1997, Bucharest, Romania
Abstract
This paper reports on the optical properties of polycrystalline p-type InxGa1-xSb (x equals 0.20) over the wavelength range 15 - 30 micrometers , at room temperature. The material was obtained by direct synthesis from the elements and rapidly crystallized following a particular temperature regime. Transmittance and reflectance measurements were performed at room temperature by using a SPECORD M80 spectrophotometer. From the resulted values we calculated the absorption coefficient (alpha) as a function of the photon energy. Considerations are made concerning the peculiarities involved by the polycrystalline structure and the surface imperfections on the absorption phenomena over the mentioned wavelength range.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cristiana E. A. Grigorescu, Stefan A. Manea, Michaela F. Logofatu, Ion I. Munteanu, B. Logofatu, Mihaela A. Calin, Mihaela Radu, and Mihail F. Lazarescu "Optical properties of polycrystalline InxGa1-xSb (x=0.20) from 15 to 30 μm", Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); https://doi.org/10.1117/12.312676
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