Spectroellipsometric characterization of multilayer systems containing Ni and Bi

V. Hutsanu; Mariuca Gartner; Constantin Ghita; Voicu Dolocan

doi:10.1117/12.312682

2 July 1998 Spectroellipsometric characterization of multilayer systems containing Ni and Bi

V. Hutsanu, Mariuca Gartner, Constantin Ghita, Voicu Dolocan

Proceedings Volume 3405, ROMOPTO '97: Fifth Conference on Optics; (1998) https://doi.org/10.1117/12.312682
Event: ROMOPTO '97: Fifth Conference on Optics, 1997, Bucharest, Romania

Abstract

In this paper an optical evaluation of the system Ni,Bi/Cu,ITO/glass system, prepared by electrochimical method is presented. Among various factors that affect the optical and structural properties of the multistructure systems we focus on the influence of the substrate and the interfacial oxidic layers. To this end we used the Spectroellipsometric (SE) method in VIS- NIR spectral range. The SE results show that the electrochemical deposited films (Ni,Bi) are porous and their refractive index depends strongly on the substrate.

Citation Download Citation

V. Hutsanu, Mariuca Gartner, Constantin Ghita, and Voicu Dolocan "Spectroellipsometric characterization of multilayer systems containing Ni and Bi", Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); https://doi.org/10.1117/12.312682

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