Paper
2 July 1998 Structured light in visual inspection
Constantin Blanaru, Virgil V. Vasiliu
Author Affiliations +
Proceedings Volume 3405, ROMOPTO '97: Fifth Conference on Optics; (1998) https://doi.org/10.1117/12.312716
Event: ROMOPTO '97: Fifth Conference on Optics, 1997, Bucharest, Romania
Abstract
When a processed part is visually inspected along a projected line of several meters in length, generated by adequate cylindrical optics, the gaussian beam intensity profile along line length will create problems given by the fading edges of the intensity profile, the variation of the light level across the line and the presence of `hotspot' in the center of the line. In order to avoid these problems, we used the structured light generated by a special developed laser diode producing a non- gaussian (evenly illuminated) distinct line. The visibility of the projected line in real working conditions, depth of field and focusing performances of the beam are presented, as they have been evaluated.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Constantin Blanaru and Virgil V. Vasiliu "Structured light in visual inspection", Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); https://doi.org/10.1117/12.312716
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KEYWORDS
Projection systems

Structured light

Optical inspection

Semiconductor lasers

Fluctuations and noise

Inspection

Visibility

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