Surface study of laser-induced charge gratings in Bi12SiO20 with an atomic force microscope

E. Soergel; W. Krieger; Valentin I. Vlad

doi:10.1117/12.312786

2 July 1998 Surface study of laser-induced charge gratings in Bi₁₂SiO₂₀ with an atomic force microscope

E. Soergel, W. Krieger, Valentin I. Vlad

Proceedings Volume 3405, ROMOPTO '97: Fifth Conference on Optics; (1998) https://doi.org/10.1117/12.312786
Event: ROMOPTO '97: Fifth Conference on Optics, 1997, Bucharest, Romania

Abstract

Light-induced charge gratings at the surface of a photorefractive Bi₁₂SiO₂₀ crystal are investigated using electrostatic force detection with an atomic force microscope. The gratings with periods of 2.7 micrometers and 0.22 micrometers are generated by two intersecting Ar⁺-laser beams at 514 nm. The dark decay times of the stored gratings are determined. Saturation processes are directly observed by a change of the profile of the charge gratings. The polarity of the charge carriers in the material is obtained using a simultaneous measurement of the light-intensity grating.

Citation Download Citation

E. Soergel, W. Krieger, and Valentin I. Vlad "Surface study of laser-induced charge gratings in Bi₁₂SiO₂₀ with an atomic force microscope", Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); https://doi.org/10.1117/12.312786

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