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25 June 1998 Short-period x-ray multilayers
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Proceedings Volume 3406, Current Russian Research in Optics and Photonics: New Methods and Instruments for Space- and Earth-based Spectroscopy in XUV, UV, IR, and Millimeter Waves; (1998) https://doi.org/10.1117/12.310984
Event: Current Russian Research in Optics and Photonics: New Methods and Instruments for Space- and Earth-Based Spectroscopy in XUV, UV, IR, 1998, none, Russian Federation
Abstract
Ultrathin Cr/Sc-multilayers were systematically investigated using tuneable soft x-ray synchrotron and x-ray tube radiation. The multilayers were optimized either for use in normal incidence or at 45 degrees at photon energies around the L-absorption edges of Sc (399 eV) and Cr (574 eV), respectively, and K-absorption edge of C (283 eV). The high reflectivity of the multilayer mirrors allows to use them for the creation of multi-mirror systems for x-ray astronomy and microscopy and x-ray diagnostics of high-temperature plasma.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. S. Andreev, A. A. Fraerman, Kiril A. Prokhorov, Nikolai N. Salashchenko, E. A. Shamov, S. A. Zuev, and F. Schafers "Short-period x-ray multilayers", Proc. SPIE 3406, Current Russian Research in Optics and Photonics: New Methods and Instruments for Space- and Earth-based Spectroscopy in XUV, UV, IR, and Millimeter Waves, (25 June 1998); https://doi.org/10.1117/12.310984
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