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29 September 1998 Adaptive system for speckle pattern interferometry
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Proceedings Volume 3407, International Conference on Applied Optical Metrology; (1998) https://doi.org/10.1117/12.323323
Event: International Conference on Applied Optical Metrology, 1998, Balatonfured, Hungary
Abstract
In our paper we have analyzed the application possibility of a modified version of speckle pattern interferometry: the adaptive speckle pattern interferometry (ASPI). The core of this technique is the using of the holographically reconstructed virtual images of reference waves. Using this solution an adaptive measuring system can be built. A developed prototype of the ASPI has been presented as a measuring device for various measuring tasks. Selected applications have been shown from real time holography to comparative displacement or contour measurement.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Janos Kornis, Attila Nemeth, and Nasser Moustafa "Adaptive system for speckle pattern interferometry", Proc. SPIE 3407, International Conference on Applied Optical Metrology, (29 September 1998); https://doi.org/10.1117/12.323323
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