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29 September 1998 Electromagnetic field in optics
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Proceedings Volume 3407, International Conference on Applied Optical Metrology; (1998) https://doi.org/10.1117/12.323324
Event: International Conference on Applied Optical Metrology, 1998, Balatonfured, Hungary
Abstract
A linearly polarized plane wave traversing an optically transparent system rarely maintains its linear polarization. In this work we discuss two aspects of this phenomenon. First, we consider the effect of a high aperture lens on polarization. This case is of utmost importance in confocal and near field microscopy and, in general, focusing. Second, the role of the polarization in hologram reconstruction is discussed.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Varga and Peter Torok "Electromagnetic field in optics", Proc. SPIE 3407, International Conference on Applied Optical Metrology, (29 September 1998); https://doi.org/10.1117/12.323324
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