8 October 1998 Frequency noise, Allan variance, and lineshape of semiconductor lasers
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Proceedings Volume 3415, Laser Diodes and Applications III; (1998) https://doi.org/10.1117/12.326631
Event: Lasers and Materials in Industry and Opto-Contact Workshop, 1998, Quebec, Canada
Abstract
We study the spectral profile of a semiconductor laser and the Allan variance according to its frequency noise spectral density, particularly in the case of filtered white noise.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruno Fermigier, Bruno Fermigier, Michel Tetu, Michel Tetu, } "Frequency noise, Allan variance, and lineshape of semiconductor lasers", Proc. SPIE 3415, Laser Diodes and Applications III, (8 October 1998); doi: 10.1117/12.326631; https://doi.org/10.1117/12.326631
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