8 October 1998 Frequency noise, Allan variance, and lineshape of semiconductor lasers
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Proceedings Volume 3415, Laser Diodes and Applications III; (1998) https://doi.org/10.1117/12.326631
Event: Lasers and Materials in Industry and Opto-Contact Workshop, 1998, Quebec, Canada
Abstract
We study the spectral profile of a semiconductor laser and the Allan variance according to its frequency noise spectral density, particularly in the case of filtered white noise.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruno Fermigier, Michel Tetu, "Frequency noise, Allan variance, and lineshape of semiconductor lasers", Proc. SPIE 3415, Laser Diodes and Applications III, (8 October 1998); doi: 10.1117/12.326631; https://doi.org/10.1117/12.326631
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