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9 October 1998 Measurements of the nonlinear index of refraction using a polarization interferometer
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Proceedings Volume 3418, Advances in Optical Beam Characterization and Measurements; (1998) https://doi.org/10.1117/12.326649
Event: Lasers and Materials in Industry and Opto-Contact Workshop, 1998, Quebec, Canada
Abstract
We propose a single-beam interferometer where a doubly refracting crystal is used to create the two interferometer's arms. The scheme uses only one mirror for these two interferometer's arms. This allows to reduce significantly the influence of mechanical and thermal fluctuations. A simple imaging system is used to avoid complex theoretical interpretations.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Artashes Yavrian, Tigran V. Galstian, and Michel Piche "Measurements of the nonlinear index of refraction using a polarization interferometer", Proc. SPIE 3418, Advances in Optical Beam Characterization and Measurements, (9 October 1998); https://doi.org/10.1117/12.326649
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