Paper
22 June 1998 Phonon-assisted photoluminescence in wurtzite GaN epilayer
Wei Liu, Ming Fu Li, ShiJie Xu, Kazuo Uchida, Koh Matsumoto
Author Affiliations +
Proceedings Volume 3419, Optoelectronic Materials and Devices; 341905 (1998) https://doi.org/10.1117/12.311027
Event: Asia Pacific Symposium on Optoelectronics '98, 1998, Taipei, Taiwan
Abstract
Photoluminescence of wurztite GaN epilayer was measured in the range of 4K to 300K. At low temperature, the neutral- donor bound exciton emission dominates the spectra, while with increasing temperature, free exciton emissions grow rapidly and finally become the dominant lines. The exciton linewidth due to exciton-phonon interaction was studied.Lo phonon-assisted photoluminescence associated with both the bound exciton and the free exciton were also observed. The temperature dependence of LO phonon-assisted emissions can be well explained by the phonon-assisted free exciton emission theory established for II-VI compound semiconductors. In particular, the study of 2LO phonon replica can provide information of the temperature dependence of the concentration and recombination lifetime of free excitons in GaN.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Liu, Ming Fu Li, ShiJie Xu, Kazuo Uchida, and Koh Matsumoto "Phonon-assisted photoluminescence in wurtzite GaN epilayer", Proc. SPIE 3419, Optoelectronic Materials and Devices, 341905 (22 June 1998); https://doi.org/10.1117/12.311027
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KEYWORDS
Excitons

Gallium nitride

Luminescence

Compound semiconductors

Phonons

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