PROCEEDINGS VOLUME 3424
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 19-24 JULY 1998
Inorganic Optical Materials
Editor(s): Alexander J. Marker
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
19-24 July 1998
San Diego, CA, United States
Materials for Microlithography Applications
Proc. SPIE 3424, Induced absorption in silica: a preliminary model, 0000 (23 September 1998); https://doi.org/10.1117/12.323748
Proc. SPIE 3424, Optical materials for microlithography applications, 0000 (23 September 1998); https://doi.org/10.1117/12.323750
Proc. SPIE 3424, Investigations and modeling of physical processes in inorganic resists for use in UV and laser lithography, 0000 (23 September 1998); https://doi.org/10.1117/12.323755
Materials for Light Management
Proc. SPIE 3424, Improved characterization of GRADIUM gradient-index glasses, 0000 (23 September 1998); https://doi.org/10.1117/12.323761
Proc. SPIE 3424, Growth of very large sapphire crystals for optical applications, 0000 (23 September 1998); https://doi.org/10.1117/12.323762
Proc. SPIE 3424, Production of infrared-transmitting chalcogenide glasses, 0000 (23 September 1998); https://doi.org/10.1117/12.323763
Materials for Interaction with Electromagnetic Radiation
Proc. SPIE 3424, Far-infrared absorption of Czochralski germanium and silicon, 0000 (23 September 1998); https://doi.org/10.1117/12.323764
Processing of Materials
Proc. SPIE 3424, Deformation of fused silica: nanoindentation and densification, 0000 (23 September 1998); https://doi.org/10.1117/12.323765
Materials for Interaction with Electromagnetic Radiation
Proc. SPIE 3424, Study of electrochromism in Ti:WO3 films by sol-gel process, 0000 (23 September 1998); https://doi.org/10.1117/12.323749
Proc. SPIE 3424, Analysis of gain characteristics of Nd-doped sol-gel-based waveguide amplifier, 0000 (23 September 1998); https://doi.org/10.1117/12.323751
Poster Session
Proc. SPIE 3424, Raman and photoluminescence investigation of ZnxCd1-xSe thin film under high pressure, 0000 (23 September 1998); https://doi.org/10.1117/12.323752
Proc. SPIE 3424, Luminescence of Li2B4O7:Tm in glassy and polycrystalline states, 0000 (23 September 1998); https://doi.org/10.1117/12.323753
Proc. SPIE 3424, Systematic studies on photorefractive crystal growth and properties of Cu- and Mn-doped (K0.5Na0.5)0.2(Sr0.75Ba0.25)0.9Nb2O6, 0000 (23 September 1998); https://doi.org/10.1117/12.323754
Materials for Light Management
Proc. SPIE 3424, Color center formation and time-resolved photoluminescence for ArF excimer laser irradiation in CaF2 single crystals, 0000 (23 September 1998); https://doi.org/10.1117/12.323756
Processing of Materials
Proc. SPIE 3424, Photochemical etching of the ZnSe surface with chlorine, 0000 (23 September 1998); https://doi.org/10.1117/12.323757
Materials for Interaction with Electromagnetic Radiation
Proc. SPIE 3424, Improved method for measuring low-level linear birefringence in optical materials, 0000 (23 September 1998); https://doi.org/10.1117/12.323758
Processing of Materials
Proc. SPIE 3424, Diffraction-limited gradient-index (GRIN) microlenses with high numerical apertures produced by silver ion exchange in glass: diffusion modeling and process optimization, 0000 (23 September 1998); https://doi.org/10.1117/12.323759
Poster Session
Proc. SPIE 3424, Solarization of AlF3-based fluoride glasses for VUV optics by ArF excimer laser irradiation, 0000 (23 September 1998); https://doi.org/10.1117/12.323760
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