PROCEEDINGS VOLUME 3425
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 19-24 JULY 1998
Optical Diagnostic Methods for Inorganic Transmissive Materials
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
19-24 July 1998
San Diego, CA, United States
Transmittance and Reflectance (Specular) Characterization of Transparent Materials
Proc. SPIE 3425, FTIR reflectance characterization of SIMOX buried oxide layers, 0000 (8 October 1998); doi: 10.1117/12.326654
Proc. SPIE 3425, Intercomparisons of reflectance measurements, 0000 (8 October 1998); doi: 10.1117/12.326663
Proc. SPIE 3425, Methods for absolute reflectance measurement of transmissive materials in the infrared, 0000 (8 October 1998); doi: 10.1117/12.326674
Proc. SPIE 3425, Problems posed by scattering transmissive materials for accurate transmittance and reflectance measurements, 0000 (8 October 1998); doi: 10.1117/12.326677
Thin Film Coatings and Filter Characterization
Proc. SPIE 3425, Characterization of narrowband infrared interference filters, 0000 (8 October 1998); doi: 10.1117/12.326678
Proc. SPIE 3425, Characterization of high-OD ultrathin infrared neutral density filters, 0000 (8 October 1998); doi: 10.1117/12.326679
Proc. SPIE 3425, Ultrathin film neutral density filter set for the infrared, 0000 (8 October 1998); doi: 10.1117/12.326680
Proc. SPIE 3425, Characterization of far-infrared optical thin film materials and blends: AgBr, AgCl, KBr, Csl, and CsBr, 0000 (8 October 1998); doi: 10.1117/12.326681
Proc. SPIE 3425, Environmental stability of rugate filters: in-situ measurements of their spectral properties, 0000 (8 October 1998); doi: 10.1117/12.326682
Spectrophotometry Standards
Proc. SPIE 3425, cSRM 2035: a rare-earth oxide glass for the wavelength calibration of near-infrared dispersive and Fourier transform spectrometers, 0000 (8 October 1998); doi: 10.1117/12.326655
Proc. SPIE 3425, Re-evaluation of spectrophotometric standard reference materials for additional geometries and wavelengths, 0000 (8 October 1998); doi: 10.1117/12.326656
Proc. SPIE 3425, Absorption-line evaluation methods for wavelength standards, 0000 (8 October 1998); doi: 10.1117/12.326657
Methods for Emittance and Low-Level Absorptance
Proc. SPIE 3425, Normal infrared spectral emittance of Al2O3, 0000 (8 October 1998); doi: 10.1117/12.326658
Proc. SPIE 3425, Multispectral pyrometry for insulating material emissometry, 0000 (8 October 1998); doi: 10.1117/12.326659
Proc. SPIE 3425, Design and operation of a highly sensitive and accurate laser calorimeter for low-absorbtion materials, 0000 (8 October 1998); doi: 10.1117/12.326660
Refractive Index Measurements
Proc. SPIE 3425, Infrared refractive indices and thermo-optic coefficients for several materials, 0000 (8 October 1998); doi: 10.1117/12.326661
Proc. SPIE 3425, AC phase measuring interferometer for measuring dn/dT of fused silica and calcium fluoride at 193 nm, 0000 (8 October 1998); doi: 10.1117/12.326662
Proc. SPIE 3425, Transient grating in KNbO3/KTaO3 superlattice, 0000 (8 October 1998); doi: 10.1117/12.326664
Proc. SPIE 3425, Measurements of index of refraction in the deep and vacuum ultraviolet using the minimum-deviation method, 0000 (8 October 1998); doi: 10.1117/12.326665
Proc. SPIE 3425, Fourier transform refractometry, 0000 (8 October 1998); doi: 10.1117/12.326666
Ellipsometry and Polarimetry
Proc. SPIE 3425, Measurements of the optical functions of uniaxial crystals using two-modulator generalized ellipsometry (2-MGE), 0000 (8 October 1998); doi: 10.1117/12.326667
Proc. SPIE 3425, FTIR-based polarimeter with high-quality Brewster's angle polarizers, 0000 (8 October 1998); doi: 10.1117/12.326668
Proc. SPIE 3425, Measurement of the refractive index of transparent materials using null polarimetry near Brewster's angle, 0000 (8 October 1998); doi: 10.1117/12.326669
Proc. SPIE 3425, Fourier transform spectropolarimetry for optical diagnostics of transmissive materials, 0000 (8 October 1998); doi: 10.1117/12.326670
Refractive Index Measurements
Proc. SPIE 3425, Determination of birefringence by Brillouin spectroscopy, 0000 (8 October 1998); doi: 10.1117/12.326671
Proc. SPIE 3425, Simple refractometers for index measurements by minimum-deviation method from far ultraviolet to near infrared, 0000 (8 October 1998); doi: 10.1117/12.326672
Proc. SPIE 3425, Variations in refractive index of color filter glasses, 0000 (8 October 1998); doi: 10.1117/12.326673
Proc. SPIE 3425, Far-ultraviolet refractive index of optical materials for solar blind channel (SBC) filters for the HST advanced camera for surveys (ACS), 0000 (8 October 1998); doi: 10.1117/12.326675
Transmittance and Reflectance (Specular) Characterization of Transparent Materials
Proc. SPIE 3425, Optical characterization of synthetic faceted gem materials grown from hydrothermal solutions, 0000 (8 October 1998); doi: 10.1117/12.326676
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