8 October 1998 Characterization of high-OD ultrathin infrared neutral density filters
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Abstract
We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 micrometer and 10.6 micrometer) systems. The use of ultrathin substrates, free of etaloning effects over the 2 micrometer to 20 micrometer spectral range, allows the FT-IR and laser measurements to be directly compared. We discuss the evaluation of the uncertainties in the transmittance values in both types of systems.
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Simon G. Kaplan, Leonard M. Hanssen, Alan L. Migdall, Glenn Lefever-Button, "Characterization of high-OD ultrathin infrared neutral density filters", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); doi: 10.1117/12.326679; https://doi.org/10.1117/12.326679
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