8 October 1998 Measurement of the refractive index of transparent materials using null polarimetry near Brewster's angle
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Abstract
The nondestructive measurement of refractive index of transmissive materials using null polarimetry is simple, accurate and does not require much on sample preparation. In null polarimetry, the ellipsometric parameter (psi) for reflection from a sample is measured. (psi) for transparent material is defined by tan (psi) equals rp/rs where rp and rs are coefficients of reflection for the p- and s-polarization respectively. By choosing the angle of incidence (Theta) near the Brewster angle, refractive index can be computed from (Theta) and (psi) directly. The only requirement on the sample is that no back surface reflection is allowed to mess up the front surface reflection. Precision in the refractive index is about 0.0004. Spectra of refractive index for quartz are measured and compared with the spectra quoted from existing Handbooks.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Soe-Mie F. Nee, "Measurement of the refractive index of transparent materials using null polarimetry near Brewster's angle", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); doi: 10.1117/12.326669; https://doi.org/10.1117/12.326669
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