PROCEEDINGS VOLUME 3426
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 19-24 JULY 1998
Scattering and Surface Roughness II
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
19-24 July 1998
San Diego, CA, United States
Scattering Theory and Analysis
Proc. SPIE 3426, Design and synthesis of random uniform diffusers, 0000 (30 October 1998); https://doi.org/10.1117/12.328441
Proc. SPIE 3426, Spectral changes of light scattered from a random metal suface in the Otto attenuated total reflection configuration, 0000 (30 October 1998); https://doi.org/10.1117/12.328450
Proc. SPIE 3426, High-frequency approximations of the full wave solutions to single and double scatter cross sections for two-dimensional random rough surfaces, 0000 (30 October 1998); https://doi.org/10.1117/12.328459
Proc. SPIE 3426, Application of MOMI iteration to solve the magnetic and electric field integral equations, 0000 (30 October 1998); https://doi.org/10.1117/12.328469
Proc. SPIE 3426, Modified Beckmann-Kirchoff scattering theory for nonparaxial angles, 0000 (30 October 1998); https://doi.org/10.1117/12.328477
Proc. SPIE 3426, Iterative approach to solving the magnetic and electric field integral equations for scattering by a dielectric thin film, 0000 (30 October 1998); https://doi.org/10.1117/12.328478
Proc. SPIE 3426, Effective mirror constituent of light scattering on a rough surface and light transfer in optical devices, 0000 (30 October 1998); https://doi.org/10.1117/12.328479
Near-Field Scattering and Speckle Correlation
Proc. SPIE 3426, Experimental studies of scatter-probe near-field optical microscopy, 0000 (30 October 1998); https://doi.org/10.1117/12.328442
Proc. SPIE 3426, Surface electromagnetic waves in near-field optical scanning microscopy, 0000 (30 October 1998); https://doi.org/10.1117/12.328443
Proc. SPIE 3426, Features in the speckle correlations of light scattered from volume-disordered dielectric media, 0000 (30 October 1998); https://doi.org/10.1117/12.328444
Proc. SPIE 3426, Analysis of microstructure changes and dynamic processes on rough surfaces using speckle correlation, 0000 (30 October 1998); https://doi.org/10.1117/12.328445
Proc. SPIE 3426, Parametric optical surface roughness measurement by means of polychromatic speckle autocorrelation, 0000 (30 October 1998); https://doi.org/10.1117/12.328446
Proc. SPIE 3426, Computer simulation studies of the speckle correlations of light scattered from a random array of dielectric spheres, 0000 (30 October 1998); https://doi.org/10.1117/12.328447
Surface Roughness, Polarization, and Detection of Surface Defects
Proc. SPIE 3426, Polarization and surface roughness, 0000 (30 October 1998); https://doi.org/10.1117/12.328448
Proc. SPIE 3426, Polarization measurement of the light scattered by dielectric randomly rough isotropic surfaces, 0000 (30 October 1998); https://doi.org/10.1117/12.328449
Proc. SPIE 3426, Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically generated microrough silicon, 0000 (30 October 1998); https://doi.org/10.1117/12.328451
Proc. SPIE 3426, Polarization of scattering by rough surfaces, 0000 (30 October 1998); https://doi.org/10.1117/12.328452
Near-Field Scattering and Speckle Correlation
Proc. SPIE 3426, Detection of subsurface defects, 0000 (30 October 1998); https://doi.org/10.1117/12.328453
Surface Roughness, Polarization, and Detection of Surface Defects
Proc. SPIE 3426, Diffuse reflectance of sintered and pressed polytetrafluoroethylene (PTFE), 0000 (30 October 1998); https://doi.org/10.1117/12.328454
Proc. SPIE 3426, Light reflection from a porous surface where the size of the pore is near the wavelength, 0000 (30 October 1998); https://doi.org/10.1117/12.328455
Surface Roughness Calibration, Instrumentation, and Application
Proc. SPIE 3426, Application of optical scatterometry to microelectronics and flat panel display processing, 0000 (30 October 1998); https://doi.org/10.1117/12.328456
Proc. SPIE 3426, NIST virtual/physical random-profile roughness calibration standards, 0000 (30 October 1998); https://doi.org/10.1117/12.328457
Proc. SPIE 3426, Characterization of planarity of polymer thin films on rough surfaces, 0000 (30 October 1998); https://doi.org/10.1117/12.328458
Proc. SPIE 3426, Roughness evaluation from ultrapure fluid transfer surface materials for microelectronics fabrication, 0000 (30 October 1998); https://doi.org/10.1117/12.328460
Proc. SPIE 3426, Handheld directional reflectometer: an angular imaging device to measure BRDF and HDR in real time, 0000 (30 October 1998); https://doi.org/10.1117/12.328461
Proc. SPIE 3426, Evaluation of in-situ ARS sensors for characterizing smooth and rough surfaces, 0000 (30 October 1998); https://doi.org/10.1117/12.328462
Proc. SPIE 3426, Novel statistical calibration method for laser scanners, 0000 (30 October 1998); https://doi.org/10.1117/12.328463
Proc. SPIE 3426, Ultraviolet scattering by thin carbon foils, 0000 (30 October 1998); https://doi.org/10.1117/12.328464
Stray Light and System Optimization
Proc. SPIE 3426, Optical design of the INTEGRAL Optical Monitoring Camera, 0000 (30 October 1998); https://doi.org/10.1117/12.328465
Proc. SPIE 3426, Globally accessible bidirectional scattering distribution function software data tool, 0000 (30 October 1998); https://doi.org/10.1117/12.328466
Proc. SPIE 3426, Modeling the affect of multiple beam clipping in FIR and submillimeter instrumentation: ISO-LWS and FIRST-SPIRE, 0000 (30 October 1998); https://doi.org/10.1117/12.328467
Proc. SPIE 3426, Modifying the Harvey-Shack surface scatter theory, 0000 (30 October 1998); https://doi.org/10.1117/12.328468
Poster Session
Proc. SPIE 3426, Common-path heterodyne interferometer with automatic focusing system for online surface profiling, 0000 (30 October 1998); https://doi.org/10.1117/12.328470
Proc. SPIE 3426, Computation of the intensity distribution for a film on a GRIN substrate, 0000 (30 October 1998); https://doi.org/10.1117/12.328471
Proc. SPIE 3426, Scatterometer at Korea Research Institute of Standards and Science (KRISS) for bidirectional reflectance distribution function (BRDF), 0000 (30 October 1998); https://doi.org/10.1117/12.328472
Stray Light and System Optimization
Proc. SPIE 3426, BRDF measurements of a new IR black coating with lower reflectance, 0000 (30 October 1998); https://doi.org/10.1117/12.328473
Surface Roughness, Polarization, and Detection of Surface Defects
Proc. SPIE 3426, Rough-surface-enhanced scattering, 0000 (30 October 1998); https://doi.org/10.1117/12.328474
Surface Roughness Calibration, Instrumentation, and Application
Proc. SPIE 3426, Comparison of PSD measurements using stray light sensors with PSD curves evaluated from topography of large AFM scans, 0000 (30 October 1998); https://doi.org/10.1117/12.328475
Stray Light and System Optimization
Proc. SPIE 3426, INTEGRAL's Optical Monitoring Camera stray-light design, 0000 (30 October 1998); https://doi.org/10.1117/12.328476
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