30 October 1998 Analysis of microstructure changes and dynamic processes on rough surfaces using speckle correlation
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The decorrelation of the characteristic speckle pattern, produced by the scattering of coherent light from a random rough surface, is used to monitor changes in the microtopography of the surface. In a basic optical setup minute alterations down to a few nanometers can be measured. To enlighten the basic relations between the speckle field decorrelation and the surface changes a theoretical model is developed, numerical calculations are carried out and comparisons with high resolution AFM measurements on two frozen states of a surface process are undertaken. Whereas the reproducibility of the AFM measurement turns out to be not precise enough to measure nanometer changes on a micrometer scale rough surface, the theoretical model is consistent with results gained from experimental variation of wavelength and angle of illumination and a-priori knowledge about the surface. It is then used to obtain information about magnitude, time constants and statistical parameters of a corrosion process.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas Fricke-Begemann, Thomas Fricke-Begemann, Frank Beyrau, Frank Beyrau, Gerd Guelker, Gerd Guelker, Klaus D. Hinsch, Klaus D. Hinsch, Peter Jauschke, Peter Jauschke, Karin Wolff, Karin Wolff, } "Analysis of microstructure changes and dynamic processes on rough surfaces using speckle correlation", Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); doi: 10.1117/12.328445; https://doi.org/10.1117/12.328445

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