30 October 1998 Detection of subsurface defects
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We present the experimental results of the detection of subsurface defects which show that the memory effect (or the far-field correlation function) of speckle patterns is sensitive to a small local change under the rough surface geometry. We envision this property can be applied to inspection of a target buried in the background by speckle mapping.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zu-Han Gu, Zu-Han Gu, Zong Qi Lin, Zong Qi Lin, Michel A. Josse, Michel A. Josse, } "Detection of subsurface defects", Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); doi: 10.1117/12.328453; https://doi.org/10.1117/12.328453

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