Translator Disclaimer
30 October 1998 Detection of subsurface defects
Author Affiliations +
Abstract
We present the experimental results of the detection of subsurface defects which show that the memory effect (or the far-field correlation function) of speckle patterns is sensitive to a small local change under the rough surface geometry. We envision this property can be applied to inspection of a target buried in the background by speckle mapping.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zu-Han Gu, Zong Qi Lin, and Michel A. Josse "Detection of subsurface defects", Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); https://doi.org/10.1117/12.328453
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
Back to Top