30 October 1998 Experimental studies of scatter-probe near-field optical microscopy
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Experiments with different types of near-field microscopes have demonstrated that the classical diffraction limit of conventional optical systems can be beaten. In these experiments, the resolution of the images is determined, primarily, by the size of the probe. One of these techniques consists of using scatterers in the near field of the sample. High resolutions have been demonstrated with this kind of scheme, although the signals are weak and the image formation is rather complex. Systematic studies are required to understand the properties and capabilities of the technique. Efforts are being made by many groups to understand the relation between the probe, the object and the image. In this work we present an experimental study of the image formation properties of different types of scatter-probe near-field optical microscopes.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Saul Alonso Zavala Ortiz, Saul Alonso Zavala Ortiz, Pedro Negrete-Regagnon, Pedro Negrete-Regagnon, Eugenio R. Mendez, Eugenio R. Mendez, "Experimental studies of scatter-probe near-field optical microscopy", Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); doi: 10.1117/12.328442; https://doi.org/10.1117/12.328442


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