30 October 1998 Light reflection from a porous surface where the size of the pore is near the wavelength
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Abstract
The effipsometry parameters is calculated for the light reflection from porous surface with the pores which go vertically in the volume and have transverse size near the wavelength, the longitudinal size much more the wavelength and the size ofthe width ofthe partition much less the wavelength. The pore is considered as the waveguide and the porous surface is appcoximated by the periOdiCal system of the coupled vertical waveguides. The results of calculations show that the porous siructures with the pore size near the wavelength can redistrib.. ute mirror component ofreflected energy sufficiently increasing it in the nanow region ofangles of incidence. Keywords: reflection, scattering, porous surfaces, ellipsometry, rough surfaces
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Vladimir Pshenitsin, Vladimir Pshenitsin, Vadim Antonov, Vadim Antonov, Alexei L. Diikov, Alexei L. Diikov, } "Light reflection from a porous surface where the size of the pore is near the wavelength", Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); doi: 10.1117/12.328455; https://doi.org/10.1117/12.328455
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