PROCEEDINGS VOLUME 3443
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 19-24 JULY 1998
X-Ray and Ultraviolet Spectroscopy and Polarimetry II
Editor(s): Silvano Fineschi
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
19-24 July 1998
San Diego, CA, United States
XUV Astronomical Observatories, Missions, and Payloads
Proc. SPIE 3443, SOPHIE: a solar EUV multilayer reflecting coronagraph, 0000 (17 December 1998); doi: 10.1117/12.333601
Optics for XUV Astronomy
Proc. SPIE 3443, Galmatheia: an FUV imaging spectrograph, 0000 (17 December 1998); doi: 10.1117/12.333607
XUV Astronomical Observatories, Missions, and Payloads
Proc. SPIE 3443, Grating stray light analysis and control in the UVCS/SOHO, 0000 (17 December 1998); doi: 10.1117/12.333614
Optics for XUV Astronomy
Proc. SPIE 3443, Performance measurements and results of the SSULI (Special Sensor Ultraviolet Limb Imager) stacked-grid collimator, 0000 (17 December 1998); doi: 10.1117/12.333615
Proc. SPIE 3443, Far-ultraviolet and visible light scatter measurements for CVD SiC mirrors for SOHO, 0000 (17 December 1998); doi: 10.1117/12.333616
XUV Astronomical Observatories, Missions, and Payloads
Proc. SPIE 3443, Multilayer grating spectrometer for solar observations, 0000 (17 December 1998); doi: 10.1117/12.333617
Applications of XUV Polarimetry and Spectroscopy
Proc. SPIE 3443, Precision determination of pion mass using x-ray CCD spectroscopy, 0000 (17 December 1998); doi: 10.1117/12.333618
Instrumentation and Techniques for XUV Polarimetry and Spectroscopy
Proc. SPIE 3443, EUV and x-ray instrumentation for spectrometry, polarimetry, and imaging in hot plasma diagnostics, atomic physics, and x-ray microscopy: a status report, 0000 (17 December 1998); doi: 10.1117/12.333602
Proc. SPIE 3443, X-ray flux concentrating optics for improving the performance of light element energy dispersive spectroscopy, 0000 (17 December 1998); doi: 10.1117/12.333603
Proc. SPIE 3443, Hard x-ray polarimetry exploiting directional information of the photoeffect in a charge coupled device, 0000 (17 December 1998); doi: 10.1117/12.333604
Proc. SPIE 3443, Soft x-ray ellipsometer using transmission multilayer polarizers, 0000 (17 December 1998); doi: 10.1117/12.333605
Proc. SPIE 3443, Large-area transmission grating spectrograph with high collecting efficiency and good spatial resolution, 0000 (17 December 1998); doi: 10.1117/12.333606
Poster Session
Proc. SPIE 3443, Minimum number of Mueller matrix nondepolarizing conditions, 0000 (17 December 1998); doi: 10.1117/12.333608
Proc. SPIE 3443, Depolarizing and deterministic systems in polarimetry, 0000 (17 December 1998); doi: 10.1117/12.333609
Applications of XUV Polarimetry and Spectroscopy
Proc. SPIE 3443, Development and evaluation of a CCD-based portable digital flash x-ray imager, 0000 (17 December 1998); doi: 10.1117/12.333610
Poster Session
Proc. SPIE 3443, Cryogenic target for low-debris soft x-ray generation, 0000 (17 December 1998); doi: 10.1117/12.333611
Instrumentation and Techniques for XUV Polarimetry and Spectroscopy
Proc. SPIE 3443, High-gain wavelength dispersive spectrometer for light element x-ray microanalysis, 0000 (17 December 1998); doi: 10.1117/12.333612
XUV Astronomical Observatories, Missions, and Payloads
Proc. SPIE 3443, White-light stray light test of the SOHO UVCS, 0000 (17 December 1998); doi: 10.1117/12.333613
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