PROCEEDINGS VOLUME 3443
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 19-24 JULY 1998
X-Ray and Ultraviolet Spectroscopy and Polarimetry II
Editor(s): Silvano Fineschi
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
19-24 July 1998
San Diego, CA, United States
XUV Astronomical Observatories, Missions, and Payloads
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 61 (17 December 1998); doi: 10.1117/12.333601
Optics for XUV Astronomy
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 2 (17 December 1998); doi: 10.1117/12.333607
XUV Astronomical Observatories, Missions, and Payloads
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 67 (17 December 1998); doi: 10.1117/12.333614
Optics for XUV Astronomy
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 7 (17 December 1998); doi: 10.1117/12.333615
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 19 (17 December 1998); doi: 10.1117/12.333616
XUV Astronomical Observatories, Missions, and Payloads
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 75 (17 December 1998); doi: 10.1117/12.333617
Applications of XUV Polarimetry and Spectroscopy
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 32 (17 December 1998); doi: 10.1117/12.333618
Instrumentation and Techniques for XUV Polarimetry and Spectroscopy
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 86 (17 December 1998); doi: 10.1117/12.333602
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 98 (17 December 1998); doi: 10.1117/12.333603
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 105 (17 December 1998); doi: 10.1117/12.333604
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 117 (17 December 1998); doi: 10.1117/12.333605
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 137 (17 December 1998); doi: 10.1117/12.333606
Poster Session
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 144 (17 December 1998); doi: 10.1117/12.333608
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 149 (17 December 1998); doi: 10.1117/12.333609
Applications of XUV Polarimetry and Spectroscopy
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 39 (17 December 1998); doi: 10.1117/12.333610
Poster Session
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 154 (17 December 1998); doi: 10.1117/12.333611
Instrumentation and Techniques for XUV Polarimetry and Spectroscopy
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 128 (17 December 1998); doi: 10.1117/12.333612
XUV Astronomical Observatories, Missions, and Payloads
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, pg 50 (17 December 1998); doi: 10.1117/12.333613
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