EUV and x-ray instrumentation for spectrometry, polarimetry, and imaging in hot plasma diagnostics, atomic physics, and x-ray microscopy: a status report

Victor L. Kantsyrev; Bruno S. Bauer; Ronald A. Phaneuf

doi:10.1117/12.333602

17 December 1998 EUV and x-ray instrumentation for spectrometry, polarimetry, and imaging in hot plasma diagnostics, atomic physics, and x-ray microscopy: a status report

Victor L. Kantsyrev, Bruno S. Bauer, Ronald A. Phaneuf

Author Affiliations +

Proceedings Volume 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II; (1998) https://doi.org/10.1117/12.333602
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The Instrumentation Program at Physics Department of the University of Nevada, Reno, USA is based on results of the development and study of one of first glass capillary optics devices in period from 1974 to earlier 90s in USSR/Russia (by V. Kantsyrev, O. Ananyin, Yu. Bykovsky and collaborators). The main direction of our program is the development of several techniques for extreme ultraviolet, soft x-ray and x-ray optical instrumentation, for spectroscopic diagnostics of hot plasmas, spectroscopic studies of interaction of multicharged ion beams with matter, biomedical x-ray microscopy. Our currently-developed instruments include: EUV polarimeter/spectrometer with GCC polarizing and focusing elements; a high resolution, a high-sensitivity EUV and x-ray spectrometer with focusing GCC, that also serves as a high- transmission window for differential vacuum pumping; a prototype of new multiband, two dimensional EUV and x-ray imaging spectrometer for plasma diagnostics; a pinhole camera with GCC using as a hard x-ray filter; a soft x-ray spectrograph with MLM for plasma diagnostics.

Citation Download Citation

Victor L. Kantsyrev, Bruno S. Bauer, and Ronald A. Phaneuf "EUV and x-ray instrumentation for spectrometry, polarimetry, and imaging in hot plasma diagnostics, atomic physics, and x-ray microscopy: a status report", Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, (17 December 1998); https://doi.org/10.1117/12.333602

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