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17 December 1998 Far-ultraviolet and visible light scatter measurements for CVD SiC mirrors for SOHO
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Abstract
Chemically-vapor-deposited (CVD) silicon carbide (SiC) has become a popular mirror material for spaceborne solar instrumentation for the vacuum ultraviolet wavelength range due to its appreciable broadband reflectance and favorable thermal and opto-mechanical properties. Scatter from surfaces of mirrors operating in this wavelength range can destroy otherwise good image contrast especially for extended targets such as the sun. While valid far ultraviolet (FUV) scatter measurements are entirely non-trivial to conduct and so are rarely performed, visible light scatter measurements are comparatively easy. Unfortunately, it is not straightforward to predict FUV scatter performance based on visible light scatter measurements for mirrors made of CVD SiC. It is hoped that by carrying out scatter measurements in both wavelength regimes for the same CVD SiC mirror, that the ability to make such predictions may be enhanced. Visible light (633 nm) scatter measurements were performed at Goddard Space Flight Center (GSFC) by two different means on CVD SiC telescope mirrors (from the same process and same vendor) for two instruments on the Solar and Heliospheric Observatory (SOHO) - - the Ultraviolet Coronagraph Spectrometer (UVCS) and Solar Ultraviolet Measurement of Emitted Radiation (SUMER). Additionally, extensive FUV scatter measurements were made for SUMER telescope mirrors. In this paper, we correlate the results for those FUV and visible light scatter measurements for this important material.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Douglas B. Leviton, Timo T. Saha, and Larry D. Gardner "Far-ultraviolet and visible light scatter measurements for CVD SiC mirrors for SOHO", Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, (17 December 1998); https://doi.org/10.1117/12.333616
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