Advanced X-ray Astrophysics Facility (AXAF): calibration overview

Stephen L. O'Dell; Martin C. Weisskopf

doi:10.1117/12.331231

19 November 1998 Advanced X-ray Astrophysics Facility (AXAF): calibration overview

Proceedings Volume 3444, X-Ray Optics, Instruments, and Missions; (1998) https://doi.org/10.1117/12.331231
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The AXAF, the x-ray component of NASA's great observatories, will launch in 1999. As integration and testing of the flight system are concluding, analysis of the ground calibration data continues. This analysis verified AXAF's unique capabilities for high-resolution imaging and for high-resolution dispersive spectroscopy. However, it finds unexpectedly high residuals between the data and the model for effective area of the AXAF optics. Reconciling the physical model with the data, to an accuracy of a few percent, remains a goal of the analysis and interpretation of the calibration data.

Citation Download Citation

Stephen L. O'Dell and Martin C. Weisskopf "Advanced X-ray Astrophysics Facility (AXAF): calibration overview", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331231

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