HETG high-order diffraction efficiency

Kathryn A. Flanagan; Norbert S. Schulz; Stephen S. Murray; Gisela D. Hartner; Peter Predehl

doi:10.1117/12.331295

19 November 1998 HETG high-order diffraction efficiency

Kathryn A. Flanagan, Norbert S. Schulz, Stephen S. Murray, Gisela D. Hartner, Peter Predehl

Proceedings Volume 3444, X-Ray Optics, Instruments, and Missions; (1998) https://doi.org/10.1117/12.331295
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Measurements at XRCF produced calibration data of the high orders of the AXAF High Energy Transmission Gratings at several energies. These tests provide a necessary complement to the limited set of laboratory high-order measurements on each of the flight gratings. We present the analysis and results of these measurements made at XRCF in Phase 2, where the flight detectors, HRC and ACIS, were employed.

Citation Download Citation

Kathryn A. Flanagan, Norbert S. Schulz, Stephen S. Murray, Gisela D. Hartner, and Peter Predehl "HETG high-order diffraction efficiency", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331295

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