19 November 1998 HETG high-order diffraction efficiency
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Measurements at XRCF produced calibration data of the high orders of the AXAF High Energy Transmission Gratings at several energies. These tests provide a necessary complement to the limited set of laboratory high-order measurements on each of the flight gratings. We present the analysis and results of these measurements made at XRCF in Phase 2, where the flight detectors, HRC and ACIS, were employed.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kathryn A. Flanagan, Kathryn A. Flanagan, Norbert S. Schulz, Norbert S. Schulz, Stephen S. Murray, Stephen S. Murray, Gisela D. Hartner, Gisela D. Hartner, Peter Predehl, Peter Predehl, } "HETG high-order diffraction efficiency", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); doi: 10.1117/12.331295; https://doi.org/10.1117/12.331295

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