Direct measurement of spreading of the primary electron cloud in the CCD

Kumi Yoshita; Hiroshi Tsunemi; Junko Hiraga; Keith C. Gendreau; Mark W. Bautz

doi:10.1117/12.330321

10 November 1998 Direct measurement of spreading of the primary electron cloud in the CCD

Kumi Yoshita, Hiroshi Tsunemi, Junko Hiraga, Keith C. Gendreau, Mark W. Bautz

Proceedings Volume 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX; (1998) https://doi.org/10.1117/12.330321
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We report here the experimental result between the x-ray interaction location and the split event. The x-ray interaction position can be localized in subpixel scale using the mesh experiment. We found that the center of gravity of the split even well correlated with the x-ray interaction position. We analyzed the data using two models, assuming the charge cloud shape: one is the rectangular model and the other is the Gaussian model. Although we could not distinguish between them, we obtained the standard deviation of the charge cloud shape of 1-2 micrometers for x-rays of Y-L, Ag-L and Ti-K. When the x-rays enter near the pixel boundary, the charge splits into adjacent pixel, in which we can achieve the accuracy of the x-ray interaction position of subpixel spatial resolution of 1.5-2.2 micrometers . We expect that the x-ray CCD can function as x-ray imager with subpixel resolution useful for the high spatial resolution optics.

Citation Download Citation

Kumi Yoshita, Hiroshi Tsunemi, Junko Hiraga, Keith C. Gendreau, and Mark W. Bautz "Direct measurement of spreading of the primary electron cloud in the CCD", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330321

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KEYWORDS

X-rays

Charge-coupled devices

Data modeling

Spatial resolution

Clouds

X-ray imaging

Copper

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