Slotted-electron-sieve integrated photosensor for gas-proportional scintillation counters

Jose A. Matias Lopes; Joaquim M. F. dos Santos; Carlos Alberto Na Conde; Richard E. Morgado

doi:10.1117/12.330326

10 November 1998 Slotted-electron-sieve integrated photosensor for gas-proportional scintillation counters

Jose A. Matias Lopes, Joaquim M. F. dos Santos, Carlos Alberto Na Conde, Richard E. Morgado

Proceedings Volume 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX; (1998) https://doi.org/10.1117/12.330326
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The performance of a new slotted electron sieve design in an integrated photo-sensor for use in xenon gas proportional scintillation detectors is described. The new design exhibits an enhanced photoelectron collection when compared to the earlier circular holes design, used for the first time in such application. The present design uses an electron sieve composed of a 50-micrometers pitch. The front surface is made photosensitive with a 150-thick CsI film. When an appropriate voltage is applied between the copper electrodes, the resulting electric field directs photoelectrons produced on the front surface through the holes in the sieve and onto a wire chamber where charge amplification occurs. Positive feedback is essentially eliminated since the charge amplification stage is optically decoupled from the photo-cathode. The electron sieve also provides a small amount of charge gain up to 2.8. The measured effective quantum efficiency, namely the number of photoelectrons traversing the electron sieve holes per incident 170-nm scintillation photon, as measured under present conditions, is about 8.3 percent. A discussion of the results is presented.

Citation Download Citation

Jose A. Matias Lopes, Joaquim M. F. dos Santos, Carlos Alberto Na Conde, and Richard E. Morgado "Slotted-electron-sieve integrated photosensor for gas-proportional scintillation counters", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330326

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