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10 November 1998 Synchrotron measurements of the absolute x-ray quantum efficiency of CsI-coated microchannel plates
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Abstract
Two identical CsI-coated, low noise microchannel plate (MCP) detectors were taken to the Daresbury Synchrotron Radiation Source (SRS) to measure their quantum efficiencies over two different energy ranges - 450 eV to 1200 eV and 4.5 eV to 9.5 eV. The SRS was run in low ring current with the beam flux monitored using single wire gas proportional counters. We present accurate measurements of edge-related absolute quantum efficiency features due to the CsI photocathodes. This data will be incorporated into the calibration program of the Advanced X-ray Astrophysical Facility High Resolution Camera.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rob M. Rideout, James F. Pearson, George W. Fraser, John Ernest Lees, Adam N. Brunton, Nigel P. Bannister, Almus T. Kenter, and Ralph Porter Kraft "Synchrotron measurements of the absolute x-ray quantum efficiency of CsI-coated microchannel plates", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330297
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