VLSI readout for imaging with polycrystalline mercuric iodide detectors

Renato A. D. Turchetta; Wojtek Dulinski; D. Husson; N. Klein; J. L. Riester; Michael M. Schieber; Asaf Zuck; M. Braiman; Leonid Melekhov; J. Nissenbaum; S. Sanguinetti

doi:10.1117/12.330293

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10 November 1998 VLSI readout for imaging with polycrystalline mercuric iodide detectors

Renato A. D. Turchetta; Wojtek Dulinski; D. Husson; N. Klein; J. L. Riester; Michael M. Schieber; Asaf Zuck; M. Braiman; Leonid Melekhov; J. Nissenbaum; S. Sanguinetti

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Proceedings Volume 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX; (1998) https://doi.org/10.1117/12.330293
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Recently polycrystalline mercuric iodide have become available, for room temperature radiation detectors over large areas at low cost. Though the quality of this material is still under improvement, ceramic detectors have been already been successfully tested with dedicated low-noise, low-power mixed signal VLSI electronics which can be used for compact, imaging solutions. The detectors used are of different kinds: microstrips and pixels; of different sizes, up to about 1 square inch; and of different thickness, up to 600 microns. The properties of this first-generation detectors are quite uniform from one detector to another. Also for each single detector the response is quite uniform and no charge loss in the inter-electrode space have been detected. Because of the low cost and of the polycrystallinity, detectors can be potentially fabricated in any size and shape, using standard ceramic technology equipment, which is an attractive feature where low cost and large area applications are needed.

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Renato A. D. Turchetta, Wojtek Dulinski, D. Husson, N. Klein, J. L. Riester, Michael M. Schieber, Asaf Zuck, M. Braiman, Leonid Melekhov, J. Nissenbaum, and S. Sanguinetti "VLSI readout for imaging with polycrystalline mercuric iodide detectors", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330293