PROCEEDINGS VOLUME 3447
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 19-24 JULY 1998
Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications
Editor(s): Ali M. Khounsary
IN THIS VOLUME

4 Sessions, 13 Papers, 0 Presentations
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
19-24 July 1998
San Diego, CA, United States
Optics and Beamline Designs
Proc. SPIE 3447, Design of a LIGA beamline using a multilayer-coated reflection mirror, 0000 (13 November 1998); https://doi.org/10.1117/12.331117
Proc. SPIE 3447, Mirror benders for white beam collimation at HASYLAB, 0000 (13 November 1998); https://doi.org/10.1117/12.331125
Mirror Substrate Design
Proc. SPIE 3447, R&D program on multisegmented piezoelectric bimorph mirrors at the ESRF: status report, 0000 (13 November 1998); https://doi.org/10.1117/12.331126
Proc. SPIE 3447, Fabrication of an aspherical mirror for extreme-ultraviolet lithography (EUVL) optics, 0000 (13 November 1998); https://doi.org/10.1117/12.331127
Proc. SPIE 3447, Design, analysis, and performance of an epoxy-bonded bendable mirror, 0000 (13 November 1998); https://doi.org/10.1117/12.331128
Cooled Optical Substrate Design
Proc. SPIE 3447, Liquid-cooled transmissive optical component, 0000 (13 November 1998); https://doi.org/10.1117/12.331129
Proc. SPIE 3447, Performance analysis of a side-cooled vertical-focusing mirror for the undulator beamline at APS, 0000 (13 November 1998); https://doi.org/10.1117/12.331118
Proc. SPIE 3447, Bendable mirrors, 0000 (13 November 1998); https://doi.org/10.1117/12.331119
Proc. SPIE 3447, Performance of side-cooled high-heat-load mirrors, 0000 (13 November 1998); https://doi.org/10.1117/12.331120
Advances in X-Ray Optics Metrology
Proc. SPIE 3447, Understanding surface scatter effects in grazing incidence x-ray synchrotron applications, 0000 (13 November 1998); https://doi.org/10.1117/12.331121
Proc. SPIE 3447, Error reduction techniques for measuring long synchrotron mirrors, 0000 (13 November 1998); https://doi.org/10.1117/12.331122
Proc. SPIE 3447, Metrology of a mirror at the Advanced Photon Source: comparison between optical and x-ray measurements, 0000 (13 November 1998); https://doi.org/10.1117/12.331123
Proc. SPIE 3447, Mirror distortion measurements with an in-situ LTP, 0000 (13 November 1998); https://doi.org/10.1117/12.331124
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