13 November 1998 Error reduction techniques for measuring long synchrotron mirrors
Author Affiliations +
Abstract
Error reduction techniques for the long trace profiler are presented. Techniques that have been used for years are critiqued, and new methods are suggested.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steven C. Irick, "Error reduction techniques for measuring long synchrotron mirrors", Proc. SPIE 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications, (13 November 1998); doi: 10.1117/12.331122; https://doi.org/10.1117/12.331122
PROCEEDINGS
8 PAGES


SHARE
Back to Top