13 November 1998 Error reduction techniques for measuring long synchrotron mirrors
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Abstract
Error reduction techniques for the long trace profiler are presented. Techniques that have been used for years are critiqued, and new methods are suggested.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steven C. Irick, Steven C. Irick, } "Error reduction techniques for measuring long synchrotron mirrors", Proc. SPIE 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications, (13 November 1998); doi: 10.1117/12.331122; https://doi.org/10.1117/12.331122
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