PROCEEDINGS VOLUME 3448
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 19-24 JULY 1998
Crystal and Multilayer Optics
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
19-24 July 1998
San Diego, CA, United States
X-Ray Crystal Monochromators for High-Power Synchrotron Beams
Proc. SPIE 3448, Water-cooled first crystal as a solution for the high-heat-load problem at the SPring-8 undulator beamlines, 0000 (11 December 1998); doi: 10.1117/12.332494
Proc. SPIE 3448, 1-40-keV fixed-exit monochromator for a wafer mapping TXRF facility, 0000 (11 December 1998); doi: 10.1117/12.332505
Proc. SPIE 3448, Second-crystal cooling on cryogenically cooled undulator and wiggler double-crystal monochromators, 0000 (11 December 1998); doi: 10.1117/12.332516
Proc. SPIE 3448, Water-cooled crystal and multilayer optics for a wiggler beamline, 0000 (11 December 1998); doi: 10.1117/12.332523
Proc. SPIE 3448, Mosaic monochromator applications at CHESS, 0000 (11 December 1998); doi: 10.1117/12.332527
X-Ray Monochromator Crystals
Proc. SPIE 3448, Production of diamond single crystals for synchrotron x-ray beamlines, 0000 (11 December 1998); doi: 10.1117/12.332528
Proc. SPIE 3448, Recent diamond single-crystal x-ray optics developments at the European Synchrotron Radiation Facility, 0000 (11 December 1998); doi: 10.1117/12.332529
Proc. SPIE 3448, Use of Na-beta alumina crystals in a soft x-ray synchrotron beamline, 0000 (11 December 1998); doi: 10.1117/12.332530
Proc. SPIE 3448, Adaptable monochromators to optimize intensity gain and resolution for experiments with high-energy synchrotron radiation, 0000 (11 December 1998); doi: 10.1117/12.332531
Commercial Beamline Components
Proc. SPIE 3448, Commercial developments in synchrotron optical components: a novel coolant for high-heat-load optics, 0000 (11 December 1998); doi: 10.1117/12.332495
X-Ray Crystal Diffraction Analysis
Proc. SPIE 3448, X-ray optics of in-situ synchrotron topography studies of the early stages of relaxation in epitaxial InGaAs on GaAs, 0000 (11 December 1998); doi: 10.1117/12.332496
Proc. SPIE 3448, Influence of the characteristics of ESRF x-ray beams on diffraction in a perfect crystal, 0000 (11 December 1998); doi: 10.1117/12.332497
Proc. SPIE 3448, Determination of coherent strain field in periodic and self-assembled microstructures on crystal surfaces, 0000 (11 December 1998); doi: 10.1117/12.332498
Proc. SPIE 3448, Multichannel analyzer/detector system for high-speed high-resolution powder diffraction, 0000 (11 December 1998); doi: 10.1117/12.332499
Proc. SPIE 3448, New diffractometer for high-energy synchrotron radiation at the elliptical multipole wiggler at the APS, 0000 (11 December 1998); doi: 10.1117/12.332500
Focusing X-Ray Crystal Monochromators
Proc. SPIE 3448, Performances of various types of benders for sagittally focusing crystals on ESRF synchrotron beamlines, 0000 (11 December 1998); doi: 10.1117/12.332501
Proc. SPIE 3448, Novel monochromator concept for sagittal micro-focusing of undulator radiation, 0000 (11 December 1998); doi: 10.1117/12.332502
Proc. SPIE 3448, Broad energy band techniques for perturbation crystallography, 0000 (11 December 1998); doi: 10.1117/12.332503
Proc. SPIE 3448, One-movement fixed-exit channel-cut monochromator, 0000 (11 December 1998); doi: 10.1117/12.332504
Proc. SPIE 3448, Diamond: a multilayer and sagittally focusing crystal as optical elements on the ID14/Quadriga-3 beamline at ESRF, 0000 (11 December 1998); doi: 10.1117/12.332506
X-Ray Fluorescence Analysis
Proc. SPIE 3448, High-resolution large-acceptance analyzer for x-ray fluorescence and Raman spectroscopy, 0000 (11 December 1998); doi: 10.1117/12.332507
Proc. SPIE 3448, Multistepped x-ray crystal diffractor based on a pseudospherical geometry, 0000 (11 December 1998); doi: 10.1117/12.332508
Proc. SPIE 3448, Use of Kirkpatrick-Baez multilayer optics for x-ray fluorescence imaging, 0000 (11 December 1998); doi: 10.1117/12.332509
Proc. SPIE 3448, Doubly focusing crystal analyzer for x-ray fluorescence holography, 0000 (11 December 1998); doi: 10.1117/12.332510
X-Ray Optical Calculations
Proc. SPIE 3448, Ray tracing simulations for crystal optics, 0000 (11 December 1998); doi: 10.1117/12.332511
Proc. SPIE 3448, Focusing properties of mosaic crystals, 0000 (11 December 1998); doi: 10.1117/12.332512
Proc. SPIE 3448, General-purpose high-resolution double-channel-cut monochromator for use on the ChemMatCARS insertion-device beamline at the Advanced Photon Source, 0000 (11 December 1998); doi: 10.1117/12.332513
Proc. SPIE 3448, Geometrical and wave optics of aperture systems, 0000 (11 December 1998); doi: 10.1117/12.332514
X-Ray Multilayers I
Proc. SPIE 3448, Multilayer films for figured x-ray optics, 0000 (11 December 1998); doi: 10.1117/12.332515
Proc. SPIE 3448, Specular and diffuse x-ray scattering from tungsten/carbon multilayers having a high reflectivity at 10 keV, 0000 (11 December 1998); doi: 10.1117/12.332517
Proc. SPIE 3448, Effect of surface roughness of substrate on grazing incidence x-ray optics, 0000 (11 December 1998); doi: 10.1117/12.332518
X-Ray Multilayers II
Proc. SPIE 3448, Optical properties of carbon compounds near carbon K-edge and their application to x-ray multilayers, 0000 (11 December 1998); doi: 10.1117/12.332519
Proc. SPIE 3448, Theoretical study of multilayer x-ray mirrors with a wide spectral band of reflection, 0000 (11 December 1998); doi: 10.1117/12.332520
Proc. SPIE 3448, Fabrication and performance of etched multilayer x-ray optics, 0000 (11 December 1998); doi: 10.1117/12.332521
Poster Session
Proc. SPIE 3448, XOP: recent developments, 0000 (11 December 1998); doi: 10.1117/12.332522
Proc. SPIE 3448, Pin-post monochromators for a wiggler beamline, 0000 (11 December 1998); doi: 10.1117/12.332524
Proc. SPIE 3448, Nine-crystal multianalyzer stage for high-resolution powder diffraction between 6 keV and 40 keV, 0000 (11 December 1998); doi: 10.1117/12.332525
Proc. SPIE 3448, Thermal conductivity of silicon, germanium, and silicon-germanium single crystals between 85 K and 300 K, 0000 (11 December 1998); doi: 10.1117/12.332526
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