Paper
11 December 1998 Optical properties of carbon compounds near carbon K-edge and their application to x-ray multilayers
Yu Sato, Andrew Domondon, Tsutomu Watanabe, Koumei Nagai, Yoshinori Iketaki
Author Affiliations +
Abstract
In order to investigate the technical feasibility of X-ray optical devises in the XANES energy region, we used typical carbon compounds with (pi) * molecular orbitals i.e. C60, C70, carbon nanotube and graphite. Their real and imaginary parts of the optical constants were studied. In this study, using XANES observation spectrum data and calculations by the Hartree-Slater method, the atomic-scattering factors of compounds near carbon K-edge region were obtained. It was found that outstanding anomalous dispersions are observed in the near carbon K-edge region; and it was also found that the compounds have peculiar and complicated optical properties due to the chemical-bond structures. Furthermore, based on the obtained results, we designed a metal/graphite normal-incident X-ray multilayer in the region and also considered its application to an X-ray microscopy.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu Sato, Andrew Domondon, Tsutomu Watanabe, Koumei Nagai, and Yoshinori Iketaki "Optical properties of carbon compounds near carbon K-edge and their application to x-ray multilayers", Proc. SPIE 3448, Crystal and Multilayer Optics, (11 December 1998); https://doi.org/10.1117/12.332519
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Carbon

X-rays

Absorption

Optical properties

Reflectivity

X-ray microscopy

Ionization

RELATED CONTENT

Carbon window soft x-ray imaging using multilayer optics
Proceedings of SPIE (September 13 2005)
Study of x ray microscopy using UV and x ray...
Proceedings of SPIE (June 15 1995)
High-resolution carbon/carbon multilayers
Proceedings of SPIE (December 24 2002)
Imaging and etching soft x ray microscopy on whole...
Proceedings of SPIE (January 13 1993)

Back to Top