6 November 1998 New stepped spherical x-ray diffractor for microprobe analysis
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Abstract
X-ray microprobe techniques require both a good spectral resolution and a high intensity. Actually, these two competitive conditions can be obtained only by x-ray spectrometers with focusing optics made by cylindrical curved crystals or by doubly curved on spherical or toroidal surface crystal monochromators. However, these devices do not allow collection of a large solid angle and therefore the experiments are limited by the source brilliance. Here we present a special device for the analysis of the x-ray secondary emission based on a new diffractor design. The device has a special shape of the reflecting surface, i.e., a pseudo- spherical stepped surface characterized by a constant angle width per step, that allows to collect the large solid angel necessary to guarantee an intense flux for the experiments of microanalysis. We will demonstrate that the efficiency of this diffractor is superior to a commercial device of similar size having a spectral resolution of 410-4 with a potential gain of about one order of magnitude.
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M. I. Mazuritsky, Alexander V. Soldatov, Augusto Marcelli, Evgeny L. Latush, "New stepped spherical x-ray diffractor for microprobe analysis", Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); doi: 10.1117/12.330334; https://doi.org/10.1117/12.330334
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